By F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill (auth.), Gavin R. Mallett, Marie J. Fay, William M. Mueller (eds.)
The papers provided during this quantity of Advances in X-Ray research have been selected from these offered on the Fourteenth Annual convention at the functions of X-Ray research. This convention, backed through the Metallurgy department of the Denver examine Institute, college of Denver, was once hung on August 24,25, and 26, 1965, on the Albany lodge in Denver, Colorado. Of the fifty six papers awarded on the convention, forty six are integrated during this quantity; additionally incorporated is an open dialogue hung on the results of chemical com bination on X-ray spectra. the themes offered signify a vast scope of functions of X-rays to various fields and disciplines. those integrated such fields as electron-probe microanalysis, the impression of chemical mix on X-ray spectra, and the makes use of of sentimental and ultrasoft X-rays in emission research. additionally integrated have been classes on X-ray diffraction and fluor escence research. there have been numerous papers on specified themes, together with X-ray topography and X-ray absorption fine-structure research. William L. Baun contributed significant attempt towards the convention by means of organizing the consultation at the influence of chemical mixture on X-ray spectra superb constitution. a different consultation was once demonstrated in the course of the first-class efforts of S. P. Ong at the makes use of and applica tions of sentimental X-rays in fluorescent research. we provide our honest due to those males, for those precise classes contributed vastly to the good fortune of the conference.
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Additional info for Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965
18. G. L. Cheney, private communication. THE APPLICATION OF CYLINDRICAL GEOMETRY FOR THE DETERMINATION OF CRYSTAL OR mN TAT ION Robert D. Forest Dow Chemical Company Denver, Colorado Richard J. Barton University of Saskatchewan Regina, Canada and N. C. Schieltz Colorado School of Mines Golden, Colorado ABSTRACT A procedure for conveniently determining the orientation of noncubic crystals is presented. The methods usually employed for cubic crystals, flat-film backreflection Laue patterns interpreted with the aid of a table of interplanar angles, is not readily adaptable to noncubics.
45 ~ • •• • I , 1 I I --Figure 12. The (l33) topograph of a Ga(As, P) deposit displays inhomogeneity. The circular regions (arrow) are thought to be silicon (or silica) inclusions which were incorporated into the deposit during epitaxial growth. Figure 13. Another silicon-rich Ga(As, P) deposit. Figure 12 reveal the incorporation of silica (or silicon) into the deposit. The variations in intensity observed in Figure 13 are also attributed to this same effect. 46 J. K. Howard and R. H. Cox Figure 14.
Forest, Richard J. Barton, and N. C. Schieltz Figure 1. Geometric figure containing both flat film and cylindrical film. Consequently, we have developed a cylindrical-geometry back-reflection Laue procedure that provides data over a range of ± 90° in azimuth and ± 30° in elevation. This records the diffraction spots of most planes of a crystal that have suitable d-spacing and scattering power. In this paper the geometry is derived and a few illustrative examples cited. The mathematical equations used in the derivation of the required net, equivalent to the Greninger net for the flat-film geometry, do not necessarily represent the simplest derivation, but the one that could best be utilized on the computer available.
Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965 by F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill (auth.), Gavin R. Mallett, Marie J. Fay, William M. Mueller (eds.)